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Handling Systems

transfers DUT to test fixturing.

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Showing results: 196 - 210 of 269 items found.

  • Large Substrate Mask Aligner

    Model 6020 - OAI

    The Model 6020 is a large substrate Production Mask Aligner or Auto-flood Exposure System for RDL First Level Advanced Packaging (PLP) and markets requiring exposure of large glass panels. It is engineered with OAI’s precision, reliability, and quality that is found in all of OAI’s products. The features include wedge effect leveling, superb process repeatability, ≤ 2.0µm printing resolution, and remote diagnostics. Using robotic handling, the system can stand alone or be fully integrated with photo resist processing.

  • Metrology System

    IVS - Onto Innovation

    The IVS 220 system is the latest generation in the IVS series and has been designed for ultimate precision, TIS (tool induced shift) and throughput on 200mm wafers. The cornerstone of the system’s reliability and stability is its mean time between failure (MTBF) of 2,100 hours. The IVS 280 provides the same capability in a package designed for overhead track handling with full E84 GEM300 capability.

  • Millimeter-Wave Isolators

    Micro Harmonics

    Our millimeter wave Faraday rotation isolators are the best choice to suppress standing waves in your systems. They have the lowest insertion loss in the industry and are the perfect choice for sensitive millimeter wave instrumentation. Our isolators employ unique diamond heat spreaders for cooler operating temperatures and improved power handling. They are 100% made in the USA and can be sole-sourced in US government acquisitions.

  • Goniophotometers

    Instrument Systems Optische Messtechnik GmbH

    All goniophotometers are designed as Type C with a horizontal alignment of the optical axis (turning luminaire configuration). Each goniometer sets benchmarks in its class for precision, reliability and handling. If these goniophotometers are combined with a spectroradiometer from Instrument Systems, they are able to determine not only photometric data but also spectral quantities, such as color coordinates, color temperature, and even color rendering index as a function of angle.

  • Electronic Loads/Sinks

    LXinstruments GmbH

    An electronic load offers the possibility of testing the specimen under different loads. Various load changes are simulated, as they can occur in normal operation. For this purpose, the relevant load current is set in a defined range and electronically controlled. For the test, different operating states are either programmed or entered into the system via an interface (USB, RS-232, GPIB...). For easy handling and quick use, there are four operating modes.

  • End-of-Line IC & MEMS Tester

    igentic® 841t - Sterner Automation Limited

    Integrated circuit (IC) and micro electro-mechanical system (MEMS) device manufacturers need to address the challenges of today's global market including increased functionality, speed and complexity while delivering components at reduced costs. Sterner Automation's igentic® 841t automated test systems meet these demanding requirements by providing a flexible platform for comprehensive end-of-line IC and MEMS device handling, testing, grading and packaging. The resulting improvements in quality assurance and process efficiency will maximize customer satisfaction and profitability.

  • High Performance LXI Microwave Multiplexers

    Pickering Interfaces Ltd.

    Pickering's LXI Microwave Multiplexers offer the highest density microwave multiplexer configurations possible, packaging 16 multiplexers into a 2U high rack. All versions of this multiplexer have an extremely high level of performance, offering low VSWR, high isolation, low loss and high power handling. Occupying only 2U of valuable rack space - our microwave multiplexers provide a space saving solution for systems requiring high performance multiplexers in the construction of microwave switching systems.

  • High Capacity, Mechanically Refrigerated Temperature Chambers

    FHC Series - Bemco Inc.

    The Bemco FHC Series of high capacity, mechanically refrigerated temperature chambers are designed for rapid temperature cycling, environmental stress screening (ESS), and for handling large thermal loads. Available in both Wide Range, (-73 C to 177 C or -100 F to +350 F) and Narrow Range (-35 C to + 177 C or -31 F to + 350 F) these systems include very large, efficient, and modern cooling and heating systems to allow rapid temperature transitions.

  • Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration

    LEON Rack - Konrad Technologies GmbH

    The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.

  • Wafer & Die Inspection

    SemiProbe

    SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.

  • Ancillary Test Cell Products

    SAKOR Technologies, Inc.

    In addition to our innovative and industry leading AccuDyne AC Dynamometers and DynoLAB Test Automation Systems, SAKOR fully integrates a complete range of ancillary products and subsystems necessary for an advanced test cell. Examples include:*Combustion air consumption measurement and conditioning subsystems*Exhaust handling systems*Fuel consumption measurement and conditioning subsystems*Coolant and oil conditioning systems*Throttle actuators*Spark/Fuel controls*Combustion analysis systems*Complete exhaust emissions analysis systems (per 40 CFR 1065 regulations)*Sound attenuating (up to STC 52) test cell enclosures with several fire suppression options*Process water evaporative cooling tower

  • Diffusion Cell Testing

    Teledyne LABS

    Teledyne LABS Phoenix™ ​D​ry‐Heat Systems make diffusion‐cell testing faster, easier, and more economical. The Phoenix System​​includes an advanced diffusion cell design. Options include the compact Phoenix DB-6 six‐cell manual sampling system and the Phoenix RDS automated sampling system ​​capable of handling up to 24 diffusion cells at once​.​​​​An important advantage of the Phoenix System is the speed with which ​receptor cell contents are homogenized. Visual testing with red dye placed on the surface of the media at the top of the sampling arm shows complete dispersion occurs within a few seconds.​​​​​​Explore the pages in this section to learn more and to configure your own system.

  • Die Sorter Handler

    4605-HTR - TESEC, INC

    4605-HTR is a MAP Sorter which picks up devices from wafer ring and sorts to tape or bin according to the MAP file created by film frame test handler or prober. 4605-HTR is a high speed handling system, available for 12 inches wafer rings. When used in combination with 4170-IH, 4605-HTR much improves efficiency in testing process of leadless devices as a high speed sorting machine.

  • Quad Core KeyStone™ DSP + UltraScale™ FPGA Module

    SMT6657-KU35 - Sundance Multiprocessor Technology Ltd.

    The SMT6657 DSP+FPGA module is a reliable and flexible platform for digital signal processing applications requiring high-performance integer and floating-point computation.It is applicable to both symmetric multiprocessing applications in which the computational load is shared by the two DSPs and asymmetric applications where one of the DSPs is responsible for hard real-time processing and the other acts as a supervisor, handling all non-deterministic communication and optionally running under control of an operating system.

  • EDEM for Academia

    DEM Solutions Ltd.

    Whether you want to deploy Discrete Element Method in your research or want to expand your curriculum with a DEM-related subject, EDEM software can add another dimension to your research and help expand horizons for your students. * Combine DEM simulation with experimental investigation to understand processes involving particles, * Develop new equipment and methods for bulk solids handling and processing, * Investigate fundamental characteristics of particle systems

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